Zeiss FIB-SEM 002 is a powerful tool that combines Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) techniques, enabling advanced sample preparation and high-resolution imaging. With its FIB capabilities, you can precisely mill and modify materials at the nanoscale, creating cross-sections or removing material to reveal internal structures. The SEM allows for detailed imaging of the modified areas or other regions of interest, providing valuable information about the sample's morphology and composition.
Zeiss FIB-SEM 002 is a powerful tool that combines Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) techniques, enabling advanced sample preparation and high-resolution imaging. With its FIB capabilities, you can precisely mill and modify materials at the nanoscale, creating cross-sections or removing material to reveal internal structures. The SEM allows for detailed imaging of the modified areas or other regions of interest, providing valuable information about the sample's morphology and composition.
Zeiss FIB-SEM 002 is a powerful tool that combines Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) techniques, enabling advanced sample preparation and high-resolution imaging. With its FIB capabilities, you can precisely mill and modify materials at the nanoscale, creating cross-sections or removing material to reveal internal structures. The SEM allows for detailed imaging of the modified areas or other regions of interest, providing valuable information about the sample's morphology and composition.
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