The Zeiss Sigma 300 is a field emission scanning electron microscope that combines high-resolution imaging with advanced analytical capabilities. It features a Gemini column and a choice of detectors, including an Inlens detector for high-resolution imaging and an SE2 detector for high-sensitivity imaging of low-voltage specimens. The Sigma 300 also offers a variety of imaging modes, including secondary electron imaging (SE), backscattered electron imaging (BSE), and transmission electron microscopy (TEM).
The Zeiss Sigma 300 is a field emission scanning electron microscope that combines high-resolution imaging with advanced analytical capabilities. It features a Gemini column and a choice of detectors, including an Inlens detector for high-resolution imaging and an SE2 detector for high-sensitivity imaging of low-voltage specimens. The Sigma 300 also offers a variety of imaging modes, including secondary electron imaging (SE), backscattered electron imaging (BSE), and transmission electron microscopy (TEM).
The Zeiss Sigma 300 is a field emission scanning electron microscope that combines high-resolution imaging with advanced analytical capabilities. It features a Gemini column and a choice of detectors, including an Inlens detector for high-resolution imaging and an SE2 detector for high-sensitivity imaging of low-voltage specimens. The Sigma 300 also offers a variety of imaging modes, including secondary electron imaging (SE), backscattered electron imaging (BSE), and transmission electron microscopy (TEM).
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