GE phoenix nanotom s Quick start guide

GE
Brand
GE
Model
phoenix nanotom s
Type
Quick start guide

GE phoenix nanotom s is a high-resolution computed tomography (CT) system that allows you to visualize and analyze the internal structure of your samples in 3D. With its sub-micron resolution, the nanotom s is ideal for a wide range of applications, including:

  • Failure analysis: Identify and analyze defects in materials and components.
  • Quality control: Inspect products for defects and ensure compliance with specifications.
  • Metrology: Measure the dimensions and shape of objects with high accuracy.
  • Research and development: Study the internal structure of materials and develop new products.

GE phoenix nanotom s is a high-resolution computed tomography (CT) system that allows you to visualize and analyze the internal structure of your samples in 3D. With its sub-micron resolution, the nanotom s is ideal for a wide range of applications, including:

  • Failure analysis: Identify and analyze defects in materials and components.
  • Quality control: Inspect products for defects and ensure compliance with specifications.
  • Metrology: Measure the dimensions and shape of objects with high accuracy.
  • Research and development: Study the internal structure of materials and develop new products.
1. Measurement
sample array detectorX-ray source
tube control CNC object stage data acquisition
computed tomography / volume reconstruction
step-by-step
rotation
e b
Acquisition o
f
a comp
l
ete series
of
2D X-ray images w
h
i
l
e rotating
t
he sample in the X-ra
y
beam
Fast and hi
g
h resolution recon
-
s
truction of the volume and
g
eneration of geometricall
y
accurate surface data
P
seudocolor com
p
arison of mea-
ured CT data and 3D CAD model
a
ll
ows a quic
k
an
d
intuitive eva
l
u-
ation o
f
t
h
e manu
f
acturing qua
l
ity
T
he precision of the measured CT data-set significantl
y
determines the accurac
y
of all following evalu
-
a
tions. For optima
l
metro
l
ogy resu
l
ts, t
h
e reconstruction a
l
gorit
h
m
h
as to ta
k
e into account an
d
correct
u
navoidable physical effects which occur during CT data acquisition like beam-hardening. phoenix|x-ray
o
ffers a wide range of modules for volume optimization.
E
xtensive so
f
tware
p
ac
k
a
g
es are avai
l
a
bl
e w
h
ic
h
a
ll
ow e.
g
. t
h
e
f
ittin
g
o
f
g
eometric
p
rimitives,
g
eome
-
t
ric dimensioning and tolerancing (GD & T) according to DIN/ISO and also the complete automatic gen
-
e
ration o
f
f
irst artic
l
e ins
p
ection re
p
orts.
T
he traceabilit
y
of the CT measurement results which are generated b
y
optimized surface extraction al
-
g
orithms is ensured by calibrated and certified (DKD certificated according to DIN
/
ISO) test specimen.
2. Evaluation
Rig
h
t: Ana
l
ysis o
f
twe
l
ve cy
l
in
d
rica
l
f
eatures.
All
images
b
y courtesy o
f
Continenta
l
AG
Fran
kf
urt, Dept. C
h
assis & Sa
f
ety
GE Sensin
g
& Ins
p
ection
T
echnologies GmbH
phoenix
|
x-ray
Nie
l
s-Bo
h
r-Str.
7
D-31515 Wunstorf | German
y
Te
l
.:
+ 4
9
503
1
.
172-
0
F
a
x
.:
+ 4
9
503
1
.
172-2
99
p
h
oenix-in
f
[email protected]
m
Fu
r
t
h
e
r
o
ffi
ces:
ph
oenix-stutt
g
art@
g
e.com
ph
oenix-muenc
h
en@
g
e.co
m
p
hoenix-france@
g
e.co
m
[email protected]
p
h
[email protected]
m
www.phoenix-xray.com
3D Metrology with High Resolution Computed Tomography:
Precise Measurement Results in just 2 Steps
First article inspection report < 1 h possible
GEIT-31206EN
(
1109
)
Left: Anal
y
sis of three features of a valve
block made of hi
g
h
g
rade aircraft alumin-
i
um (ed
g
e len
g
th 130 mm
)
In order to demonstrate the accurac
y
of the CT data the part was ad-
ditionally analysed by means of a Leitz
/
Hexagon high precision 3D
CMM. The table contains a small extraction of the first article ins
p
ec-
tion report. It s
h
ows a very goo
d
correspon
d
ence o
f
t
h
e two met
h
-
ods (deviation between 3D CMM and CT ≤ 6
μ
m for diameters and
distances
)
.
Feature Ø
Z 1
Distance
D 1
Nom. CAD 28.000 70.500
Tolerance 0.050 0.100
Meas. CT 28.035 70.442
Meas. CMM 28.034 70.447
Deviation
CT / CMM 0.001 -0.005
GE
Sensing & Inspection Technologies
phoenix|x-ray
Certifi ed Precision
  • Page 1 1

GE phoenix nanotom s Quick start guide

GE
Brand
GE
Model
phoenix nanotom s
Type
Quick start guide

GE phoenix nanotom s is a high-resolution computed tomography (CT) system that allows you to visualize and analyze the internal structure of your samples in 3D. With its sub-micron resolution, the nanotom s is ideal for a wide range of applications, including:

  • Failure analysis: Identify and analyze defects in materials and components.
  • Quality control: Inspect products for defects and ensure compliance with specifications.
  • Metrology: Measure the dimensions and shape of objects with high accuracy.
  • Research and development: Study the internal structure of materials and develop new products.
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