LeCroy SDA Expert Software User manual

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SDA Expert Software
Instruction Manual
SDA Expert Software Instruction Manual
© 2023 Teledyne LeCroy, Inc. All rights reserved.
Users are permitted to duplicate and distribute Teledyne LeCroy, Inc. documentation for internal educational purposes only.
Resale or unauthorized duplication of Teledyne LeCroy publications is strictly prohibited.
Teledyne LeCroy is a trademark of Teledyne LeCroy, Inc., Inc. Other product or brand names are trademarks or requested
trademarks of their respective holders. Information in this publication supersedes all earlier versions. Specifications are
subject to change without notice.
October, 2023
sdax-im-eng_16oct23.pdf
Contents
About This Manual iii
Introducing SDA Expert 1
Integrated Software Framework 1
An "Expert" Approach to Serial Data Analysis 1
Requirements 2
Getting Started 3
Accessing SDA Software 3
SDA Expert Framework 3
Multi-view Comparison Mode 6
SDAX Descriptor and Status Messages 7
SDA Expert Report 8
Quick View 9
Signal Set Up 10
Standard and Nominal Rate 10
Serial Data Inputs 11
Sampling Phase 11
Levels & Thresholds 11
Test Pattern Selection 12
Test Point Selection 14
Acquisition Settings by Standard 16
Jitter/Noise Simulator 19
Emphasis 22
Eye Doctor Emulation and De-embedding 23
Tool Selection 23
Configuration 23
Bandwidth Limit 24
Upload and Map S-parameters 24
Apply Model 25
Fixture andChannel Dialogs 25
Touchstone Plot 26
VirtualProbe Emulation and De-embedding 27
Virtual Probe Dialog 27
Probe Location 28
Applying the Model 28
VP Setup Dialog 28
VP Block Dialog 30
VP Xtalk Dialog 32
VP Plot 33
VP Zoom Dialog 33
Equalizers 34
Linear EQ Dialog 34
Decision Feedback Equalizer (DFE) 38
Clock Set Up 40
Bit Rate and Clock Edge 40
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SDA Expert Software Instruction Manual
Crossing Level 41
PLL Setup 41
PLL Types 42
Reference Clock Set Up 46
Accumulate 47
NRZ Signal Analysis 48
Eye Diagram Analysis 48
NRZ Jitter Analysis 61
NRZ Noise Analysis 70
NRZ Crosstalk Analysis 77
PAM Signal Analysis 78
PAMn Eye Analysis 78
PAMn Jitter Analysis 81
PAMn Measurements (SNDR and RLM) 83
Pulse and Tx EQ Measurements 86
Tx EQ Preconfiguration by Standard 86
Pulse Measurements 88
Tx EQ Limits by Standard 92
Electrical-PHY Measurements 95
Measurement Mode 95
Measurement Display 95
Exporting Measurement Data 95
DisplayPort Measurements 96
PCI Express Measurements 101
USB 3.2 Measurements 111
USB4/Thunderbolt Measurements 115
Reference 120
DisplayPort Test Point Settings 120
PCI Express Test Point Settings 124
USB 3.2 Test Point Settings 131
USB4/Thunderbolt Test Point Settings 136
Clock Recovery Implementation Using a PLL 137
Eye Analysis Theory 139
Noise Measurement Algorithm 139
Jitter Measurement Algorithms 141
Jitter Measurement Calculation 143
Crosstalk Eye Algorithm 144
FFE Filter Algorithm 145
Touchstone File Format 147
Technical Support 149
ii
About This Manual
About This Manual
This manual covers the operation of all the SDA Expert software options, along with the Eye Doctor II and
VirtuaProbe capabilities that integrate with SDA Expert.
Some images in this manual may depict different options than are in your installation, or were taken on a different
model oscilloscope, which will slightly alter the appearance of the GUI.
Despite the difference in appearance, however, the functionality is the same unless otherwise stated. Where there
are differences or limitations in capabilities, these are explained in the text.
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SDA Expert Software Instruction Manual
iv
Introducing SDA Expert
Introducing SDA Expert
SDA Expert (SDAX) is the latest in the family of Teledyne LeCroy Serial Data Analysis software options. It provides
comprehensive measurement capabilities tailored to the requirements of the most widely used high-speed serial
data standards.
Integrated Software Framework
As with our previous SDA software options, the integrated SDA framework makes all the tools needed for high-speed
serial data analysis available through a coordinated data "flowchart." Depending on your options, you can:
lPerform eye diagram, jitter and noise analysis on a single lane of data plus a saved reference lane using a
variety of visual plots and measurement parameters
lSimulate jitter, noise and crosstalk on data or clock signals
lApply Eye Doctor emphasis and equalization
lApply Eye Doctor or VirtualProbe emulation and de-embedding
lSimultaneously analyze eye diagrams, jitter and noise on up-to-four lanes of data
lAnalyze crosstalk on multi-lane NRZ signals through the generation of a special crosstalk eye diagram
lMeasure pulse response and TxEQ presets
lGenerate a complete SDA Expert Report of your analysis
An "Expert" Approach to Serial Data Analysis
SDA Expert options for a particular technology include all the software needed to perform Electrical-PHY
measurements to the specifications and feature "Expert Mode" configuration of all required settings. You simply
choose the serial standard and tell us what inputs, DUT type and test points to use, then we will apply our decades of
experience working with serial data to configure:
lSignal emphasis and equalization
lChannel emulation and fixture de-embedding
lClock recovery and PLL settings
lEye diagram and eye mask selections
lElectrical-PHY measurements using specified limits and number of UI/pattern repetitions
It's like having us at your side at a workshop.
Your SDA Expert installation can be as simple or complex as you need. All software necessary to measure a given
technology to standard is included in a single option; no base installation of other options is required. New
capabilities are integrated into the SDA framework with the addition of each SDA Expert option without disrupting
the overall processing flow.
The table below lists the capabilities made available with each SDA Expert option.
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SDA Expert Software Instruction Manual
Option Key Capabilities
SDA Expert NRZ SDAX-NRZ lComprehensive eye, jitter and noise analysis of a single lane
of custom or standard NRZ data plus a saved Reference Lane
lPLL and mask selection for numerous NRZ-based standards
lJitter/noise simulator
lPulse and TxEQ measurements
lSDA Expert Report
SDA Expert PAM SDAX-PAM lComprehensive eye, jitter and noise analysis of a single lane
of custom PAM3/PAM4 data plus a saved ReferenceLane
lEqualizers (CTLE, FFE, DFE) for PAM3/PAM4 data streams
lJitter/noise simulator
lPulse and TxEQ measurements
lSDA Expert Report
SDA Expert Complete SDAX-Complete lCombined capabilities of SDAX Expert NRZ and
SDAX Expert PAM
lMulti-lane analysis of four lanes of data plus saved Reference
lane
lEye Doctor and VirtualProbe emphasis, emulation/de-
embedding and equalization tools
lCrosstalk analysis of multi-lane NRZ signals
SDA Expert PCIe®NRZ
SDA Expert PCIe®6.0
SDA Expert USB 3.2
SDA Expert USB4®/Thunderbolt™
SDA Expert DisplayPortâ„¢
SDAX-PCIE-NRZ
SDAX-PCIE6
SDAX-USB3.2
SDAX-USB4-TBT
SDAX-DP
l"Expert" configuration of clock recovery, emphasis, de-
embedding/emulation and equalizers with standard and test
point selection
lEye Doctor emphasis and equalization tools
lEye Doctor or VirtualProbe emulation and de-embedding tools
lComprehensive eye, jitter and noise analysis of a single lane
of standard data plus saved Reference Lane
l"Expert" configuration of standard electrical-PHY
measurements
lJitter/noise simulator
lPulse and TxEQ measurements
lSDA Expert Report
lSimplified output of conditioned signals to decoders
Requirements
64-bit MAUI (X-StreamDSO) version 10.4.1.x or higher is required to support any of the SDA Expert options.
Firmware upgrades are available from: teledynelecroy.com/support/softwaredownload. You must create a user
account to download software. Following that, you will receive notice of new firmware releases.
2
Getting Started
Getting Started
Accessing SDA Software
Access the SDA software by choosing Analysis>Serial Data from the menu bar.
Tip: If you are already displaying SDA views or measurements, you can re-open the SDA dialogs simply by
clicking on a descriptor box or one of the measurement table headers.
SDA Expert Framework
The SDA framework on the SDAX dialog shows the overall flow for using SDA Expert to view and analyze serial data.
The active blocks represent those capabilities that are enabled in your SDA Expert software installation. If a block is
disabled ("grayed out"), the software required for that capability has not been activated.
Each block in the flowchart is a button that, when touched, displays the corresponding configuration dialog. The
lines connecting the blocks show the order of processing as signal flows from input channel to output "views." The
text displayed beneath each block gives information about the setup at that stage for the selected lane. Different
lanes of data can undergo different flows.
SDA framework for custom NRZ signals.
SDA framework for custom PAM3 signals, with PAM measurements and equalizers needed for PAM signals.
Select Enable SDAX at the far left to begin. Deselecting it will disable analysis and turn off all views.
Serial Standard
This initial selection drives all the other options on the SDA framework. Selecting a specific Serial Standard will set
the bitrate, mask and PLL for you as defined by the standard. It will also make some further changes to the
configuration dialogs in keeping with how the standard calculates jitter and noise.
If analyzing a custom NRZ signal, or a standard based on NRZ (using SDAX-NRZ), select NRZ.
For custom PAM3 or PAM4 signals (using SDAX-PAM), select the respective modulation type.
If analyzing DP, PCIe or USB signals using a technology-specific option, select the respective standard and data rate.
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SDA Expert Software Instruction Manual
Lane Selector
The Lane field selects the lane to be configured. The Enable checkbox next to it activates the lane display. When
multiple lanes are enabled, the oscilloscope will enter Multi-view Comparison Mode .
Note: A lane must be enabled for views and measurements calculated on it to be displayed.
Ref Lane button opens the reference lane for configuration.
Store Lane to Ref button saves the setup and data of the active lane to the "Ref" lane, where you can add/change
processing for comparison purposes. The name of the stored lane appears to the right of the button when in use.
Copy Lane Setup button opens a window for copying the setup and data of any lane to another.
Signal Inputs
Select Signal Inputs to configure the probing method and signal source(s), and if necessary to tune the logic
crossing level(s) or specify the Test Pattern to improve eye generation. The Signal dialog is also where you make the
Test Point selection when using technology-specific options.
Signal Conditioning
As with the signal and clock, most of these settings are made automatically following the test point selection when
using technology-specific options. For custom signals, you can manually configure them as you wish.
Select Emphasis to configure pre-emphasis/de-emphasis settings.
Select De-embed/Emulate to configure fixture de-embedding and channel emulation using either the Eye Doctor II or
the VirtualProbe capabilities.
Select Linear EQ to apply Continuous Time Linear Equalization (CTLE) or FeedForward Equalization (FFE).
Select DFE to configure Decision Feedback Equalization.
Clock
The Clock Recovery button opens the Clock dialog.
The Clock Recovery Source switch is the unlabeled button immediately to the left of the Clock Recovery block.
When using an explicit reference clock, toggle the switch to the "Yellow"position to activate the Ref Clock block.In
this position, the clock recovery algorithm uses transitions of the reference clock signal. The Ref Clock Input block
opens the Ref. Clock dialog for configuring the source and attributes of the clock signal.
When the Clock Recovery Source switch is set to the default "Blue" position, SDA performs software clock recovery
using the input signal following Linear EQ processing.
4
Getting Started
Analysis Views and Measurements
These capabilities allow you to visualize and measure the signal after all prior processing has been applied.
NRZ Signal Analysis
Eye Meas. opens the dialog for configuring NRZ eye diagrams.
Jitter Meas. opens the dialog for configuring NRZ jitter measurements.
Noise Meas. opens the dialog for configuring NRZ vertical noise measurements.
Crosstalk Meas. (multi-lane only) opens the dialog for configuring NRZ crosstalk analysis.
PAM Signal Analysis
PAMnEye opens the dialog for configuring PAM3 and PAM4 eye diagrams.
PAMnJitter opens the dialog for configuring PAM3 and PAM4 jitter measurements.
PAMnMeasurements opens the dialog for configuring PAM3 and PAM4 noise measurements.
Pulse and Tx EQ Measurement
Pulse Measure opens the Pulse and Tx EQ dialog for measuring pulse response and Tx FFE coefficients.
Technology-specific Electrical-PHY Measurements
Electrical-PHY measurements as defined by standard are made available with technology-specific DisplayPort, PCI
Express®and USB options. When the Serial Standard selection is other than "custom" NRZ, PAM3 or PAM4, the
generic Measurements dialog is replaced by one named for the standard (e.g., PCIe 64 GT/s), and there are other
subtle changes to the framework flow all reflecting the tailoring of the analysis process to that standard.
SDA framework for PCIe 5.0, showing addition of PCIe 32 GT/s dialog for technology-specific measurements. Note the
addition of the emphasis and emulation/de-embedding tools, needed to test a signal to standard.
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SDA Expert Software Instruction Manual
Multi-view Comparison Mode
The Lane field to the left of the SDAX dialog selects a lane for configuration. The Enable checkbox next to the Lane
field turns on the display of that lane for analysis. While you can only open one lane at a time for configuration, you
can view and measure any combination of lanes simultaneously.
When multiple lanes are shown, the oscilloscope activates Multi-view Comparison Mode. In this mode, all the views
of each lane are placed in separate tabs. A new tab is added to the display for each lane shown. To close a tab,
deselect the Enable checkbox for that lane.
Multi-view Comparison Mode can be used to either compare the signal at different test points in a single link (Lane1
and Ref Lane) or to compare the test results of up to four lanes on the same DUT with the SDAX-Complete option.
Multi-view comparison mode display of four lanes of DisplayPort data. Each tab shows all the views of each lane and
have been renamed to include ML.0, ML.1, etc.
Note: What appears on a tab depends on your selected "views". All views are synchronized between tabs.
Renaming Tabs
To give each set of views a user-identifiable name, right-click (touch-and-hold) on the Lane# tab, then use the virtual
keyboard to "type" the new name.
Moving Traces
Multi-view Comparison Mode is architected to facilitate easy comparison of SDA results. To prevent
misinterpretation of results, the different views of each lane can only be displayed on its own tab; you cannot move
these traces to grids on other tabs.
Non-SDA waveforms (C1, F1, Z1, M1, etc.) are not locked and can be moved from one tab to another by dragging-
and-dropping the trace descriptor box onto the desired grid.
6
Getting Started
SDAX Descriptor and Status Messages
When SDAX is enabled, the SDAX descriptor box is added to the display next to the Timebase and Trigger
descriptors. Under normal operation, it shows the Serial Standard or custom signal type and data rate tested.
Touching the descriptor will re-open the SDA Expert dialogs, if they are closed.
However, if there is an application state that could possibly lead to erroneous measurements, the descriptor issues a
status message:
Click on the descriptor box to go to the setup dialog where the setting in question can be corrected. In some cases,
there will be a red "LED" indicator next to the problematic setting.
Following is a list of status messages that may appear in the SDAX descriptor.
Message Occurs when...
Emulate / Deembed setup needs attention Files (e.g., S-parameters) or settings required to de-embed / emulate a fixture or
channel have not been specified or are missing from the path; the de-embedding
setup has not been Applied in order to build the circuit model.
DFE training failed There is too low sample rate or too few UIs/pattern repetitions for the DFE to train;
the wrong pattern is specified.
Check Jitter status! There is no signal found on the specified input; a jitter analysis setting needs cor-
rection; there is a pattern mis-match.
Low statistics Too few UIs or pattern repetitions in acquisition for valid measurements.
Pattern mis-match! The signal pattern does not match the pattern specified for the measurements;
there is no recognizable signal on the input. Change the pattern from the DUT to
the pattern shown on the measurement dialog. If the pattern is still not recognized,
on the Test Pattern subdialog, choose a Built-in pattern or upload a pattern file.
Differential inputs required The measurement requires a differential signal, but the input selection is single-
ended. On the Signal dialog, make the selections required for a differential signal.
Be sure there is a differential signal on the designated channel(s).
Pattern inverted! The input signal pattern is the inverse of the expected pattern (perhaps due to inad-
vertently reversing the inputs). On the Test Pattern subdialog of the Signal dialog,
check Invert Pattern.
Pulse reference for TxEQ required An unequalized reference pulse must be saved prior to making Tx EQ meas-
urements. Go to the Tx EQ dialog and follow the procedure for Reference Pulse
Measurement.
No lanes enabled At least one Lane must be enabled (shown) for any measurements or graphs to be
displayed. On the SDAX dialog, choose a Lane, then check the Enable box next to it.
Accumulation complete The number of UIs/pattern repetitions set on the Accumulate dialog has been
reached. Additional acquisitions will not be computed into SDAX measurements.
Noise reference required The selected noise measurements require a saved reference pulse (to be used for
noise removal). Note: This is primarily used for PCIe 6.0 Compliance pattern meas-
urements.
Noise reference not enabled The noise reference pulse has not been applied to the model. Note: This is primar-
ily used for PCIe 6.0 Compliance pattern measurements.
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SDA Expert Software Instruction Manual
SDA Expert Report
Clicking the SDA Expert Report button on the SDAX dialog generates a PDF report showing the active screen,
measurements and views. The report contains links to exported .csv files of table data.
Reports are saved in oscilloscope D:\Reports. You will have an opportunity to rename or move the PDF upon
creation by clicking Browse and making your selection.
By default, subsequent reports are auto-named using the Report Filename you enter, with a number series appended
to it.
The SDA Expert Report feature also generates a LabNotebook file that saves the setups, waveform data and screen
image. LabNotebooks are saved in oscilloscope D:\LabNotebook.
8
Getting Started
Quick View
The Quick View automatically generates all the basic eye and jitter views and measurements of the input signal:eye
diagram with bathtub curve and NQ-scale, RjBUj jitter track, RjBUj jitter histogram, and RjBUj jitter spectrum.
Note: The Quick View is only available for Lane 1 data.
Quick View display.
To set up the Quick View:
1. On the SDAX dialog, select the Serial Standard and touch the Quick View button.
2. On the Quick View popup, enter the Serial Data Input(s) and click OK to generate the view.
3. If necessary, you can adjust the Crossing Level/Symbol Rate on the Quick View popup until you see a good
eye diagram. The function of the controls is the same as on the Signal Dialog.
Caution: Using Quick View will clear the current configuration on the Lane and instead apply the
configuration made within the Quick view window.
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SDA Expert Software Instruction Manual
Signal Set Up
Use the Signal dialog to define the probing method and basic characteristics of the input signal after making the
Serial Standard selection on the SDAX dialog.
Note: When using a technology-specific option, many of these settings are preconfigured with the Serial
Standard selection. For best results, acquisitions should be long enough to include at least 100,000 UI of the
signal under test, or whatever is specified for the Eye,Tx EQ and Electrical-PHY measurements by standard.
By using sufficiently long acquisitions, you will have the best statistics for accurate measurements and be
able to measure low-frequency periodic jitter components. Be aware, however, that processing time
increases as length of acquisition increases, so we recommend limiting records to only the required number
of UIs/pattern repetitions.
Signal dialog for custom NRZ signals.
Signal dialog when using technology-specific SDA Expert PCIe NRZ. Notethe addition of the PCIe 32 GT/s tab and the
Test Point subdialog, and that the Nominal Rate is locked to match the standard.
Standard and Nominal Rate
If your installation supports "custom" NRZ waveforms, in Standard choose any NRZ-based protocol in use. This
selection automatically sets the Nominal Rate specified by that standard and populates the Mask Type field on the
Eye dialog and the PLL field on the Clock dialog.
When measuring a truly custom signal, always enter the bit rate in Nominal Rate. Using an incorrect Nominal Rate
can lead to incorrect equalizer results, since this value is used by several of the equalizers. Run the Bit Rate
parameter on a short acquisition if you are unsure.
Select Show Input Signal to display a waveform trace of the "raw" input signal without any SDA signal processing.
Note: The input trace will still be affected by any math or channel pre-processing applied outside of SDA.
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Signal Set Up
Serial Data Inputs
If you are using a differential probe or a single-ended probe/cable, select 1 Input (or Diff. Probe) and enter the input
source channel.
If you have a differential signal transmitted over two cables or single-ended probes, select Input1-Input2 and enter
the input sources.
Note: There is no need to first create a math function to calculate the difference between two inputs.
However, whenever using two inputs, be sure that both have the same record length and sample rate.
You can choose to Upsample the input signal(s) in order to provide a higher sample density for analysis.
Tip: In the past, this was typically done to facilitate formation of eye diagrams without gaps for bit rates
integrally related to the sampling rate (for example, 20 GS/s is exactly eight times 2.5 Gb/s), and especially
for relatively short acquisitions. However, this is now unnecessary to remove gaps in the eye. For that
purpose, use the Upsample control on the Eye Diagram dialog.
Sampling Phase
The Sampling Phase determines where in the unit interval the sample is taken for noise measurements. Enter the
position in thousandsths of a UI (mUI).
The defualt setting of 500 mUI represents the Center Phase. Touch Center Phase to return to this value.
For NRZ signals, enter the Levels Used for calculating noise measurements.
Levels & Thresholds
For NRZ signals, choose a Level Type of either Absolute volts or Percent amplitude.
For PAM3 and PAM4 signals, enter either the percent amplitude or the absolute voltage level that marks the crossing
threshold for each level in the signal.
Touch the Find Level button to allow the software to calculate the actual level from the input signal:
lFor NRZ signals, the software locates the midpoint between the highest and lowest signal levels in the current
acquisition.
lFor PAMnsignals, the software finds the best fit estimates of the four levels and their mean thresholds.
To prevent false determinations due to noise, etc., enter a Hysteresis value. The default hysteresis band is 500 mDiv
(half of a division), centered on the crossing threshold. Edges that fail to transit the entire hysteresis band are not
detected.
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SDA Expert Software Instruction Manual
Test Pattern Selection
If the signal from the DUT is good, it is sufficient to allow the software to Auto Detect any pattern in the input signal
(the default setting). However, for custom signals, and in cases of severely degraded signals, the software will need
assistance in determining what is the pattern being sent in order to accurately recover the clock and generate an
eye. To do this, you may either:
lChoose one of the Built-in pattern selections for a given standard
lUpload a custom pattern From File.
The Symbol file is a simple text file formatted as described below. To read the pattern from file:
1. Place the file on the oscilloscope D: drive--the default is D:\Applications\SDA3
2. Use the Browse button to navigate to and select the file.
3. With the file name shown, press Read Symbol File.
You will see a message indicating the pattern was recognized correctly or else any error that occurred.
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Signal Set Up
Symbol File Format
The symbol file is a text file listing voltage levels that make up one block of symbols, one line per block read from left
to right. Valid symbols are:
lNRZ: 0 and 1
lPAM3: 0, 1 and 2
lPAM4: 0, 1, 2 and 3
The following rules apply:
lNo start or end indicators, commas or other delimiters are to be used
lSpaces are not read and may or may not be used (e.g., 1 0 1 1 is the same as 1011)
lAny line preceded by hyphens "-" is treated as a comment and is not parsed.
You may optionally include a header section describing the symbol blocks to follow, preceding each line of the
header and any other descriptive text with hyphens. The example below shows a section of the PCIe 6.0 Compliance
Pattern symbol file.
Invert Pattern
If you have accidentally connected your signal in reverse of the intended polarity, use the Invert Pattern checkbox to
correct the signal. This is most useful when using Auto Detect, as there should be no reason to invert a built-in
pattern or one read from a symbol file.
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SDA Expert Software Instruction Manual
Test Point Selection
Following the Serial Standard selection on the SDA framework, the Test Point is the most important configuration
choice when using technology-specific options. Choose the Device Type and Test Point being tested. The options for
each will change depending on your serial standard.
When you select Apply Test Point, most everything required by standard to test that device at that point is
automatically set and a new circuit model built, including clock PLL, eye mask, emphasis, equalizers, fixture de-
embedding and channel emulation. The exact clock rate is found (as when selecting Find Rate) and the Eye Diagram
at the selected test point is turned on for you to begin analysis.
Caution: Configuring a new test point will clear all accumulated sweeps and measurements. Be sure to
create an SDAX Expert Report or otherwise save any data you wish to preserve before applying.
The Test Pattern is usually left to Auto Detect the pattern being sent from the DUT, although in cases of seriously
degraded signals, you may need to manually define the Test Pattern. If an eye mask is defined for the Test Point, the
Eye dialog will open for you to begin eye diagram analysis.
Note: See the technology-specific topics linked below for a list of settings made by the software for each
Test Point. Some additional settings may be required to test to standard, depending on the measurement,
Device Type and Test Point combination. For best results, acquisitions should be long enough to include at
least 100,000 UI of the signal under test, or whatever is specified for the Eye,Tx EQ and Electrical-PHY
measurements. By using long acquisitions, you will have the best statistics for accurate measurements and
be able to measure low-frequency periodic jitter components.
Test Point Nomenclature
The diagram that appears on the Test Point subdialog represents the channel connecting transmitter (Tx) to receiver
(Rx). Text in blue shows what has been configured in SDA Expert as a result of your selection:
lLocation of measured test point
lFixtures de-embedded or channels emulated using S-parameters
lCompliance equalizers applied prior to measurement
For example, the DisplayPort UHBR10 (over USB-C) TP3-EQ test point diagram (above) indicates:
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