Agilent Technologies E8356A is a vector network analyzer with a built-in LCD display, hard and floppy disk drives, S-parameter test set and synthesized source. The analyzer has two 50 ohm Type-N (f) test ports. With a frequency range from 300 kHz to 3 GHz, it offers full S-parameter measurements and is suitable for characterizing passive and active devices.
The E8356A's time-domain capability (Option 010) enables viewing reflection and transmission responses in time or distance domain. The configurable test set (Option 015) provides front panel access to the source output and coupler input on both ports 1 and 2, allowing for improved measurement sensitivity and the addition of external components and instruments.
Agilent Technologies E8356A is a vector network analyzer with a built-in LCD display, hard and floppy disk drives, S-parameter test set and synthesized source. The analyzer has two 50 ohm Type-N (f) test ports. With a frequency range from 300 kHz to 3 GHz, it offers full S-parameter measurements and is suitable for characterizing passive and active devices.
The E8356A's time-domain capability (Option 010) enables viewing reflection and transmission responses in time or distance domain. The configurable test set (Option 015) provides front panel access to the source output and coupler input on both ports 1 and 2, allowing for improved measurement sensitivity and the addition of external components and instruments.
Agilent Technologies E8356A is a vector network analyzer with a built-in LCD display, hard and floppy disk drives, S-parameter test set and synthesized source. The analyzer has two 50 ohm Type-N (f) test ports. With a frequency range from 300 kHz to 3 GHz, it offers full S-parameter measurements and is suitable for characterizing passive and active devices.
The E8356A's time-domain capability (Option 010) enables viewing reflection and transmission responses in time or distance domain. The configurable test set (Option 015) provides front panel access to the source output and coupler input on both ports 1 and 2, allowing for improved measurement sensitivity and the addition of external components and instruments.
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