Tektronix TDS7000 Series is an advanced oscilloscope that offers a wide range of capabilities for various applications. It can be used for:
Probe calibration and deskew: The TDS7000 Series can be used to calibrate passive probes, optimize gain and offset accuracy at the probe tip, and compensate for timing differences between voltage and current probes.
Signal analysis: The oscilloscope can be used to analyze signals with a variety of features, including waveform measurements, FFT analysis, and mask testing.
Data logging and storage: The TDS7000 Series can be used to log and store waveform data for later analysis.
Tektronix TDS7000 Series is an advanced oscilloscope that offers a wide range of capabilities for various applications. It can be used for:
Probe calibration and deskew: The TDS7000 Series can be used to calibrate passive probes, optimize gain and offset accuracy at the probe tip, and compensate for timing differences between voltage and current probes.
Signal analysis: The oscilloscope can be used to analyze signals with a variety of features, including waveform measurements, FFT analysis, and mask testing.
Data logging and storage: The TDS7000 Series can be used to log and store waveform data for later analysis.
Tektronix TDS7000 Series is an advanced oscilloscope that offers a wide range of capabilities for various applications. It can be used for:
Probe calibration and deskew: The TDS7000 Series can be used to calibrate passive probes, optimize gain and offset accuracy at the probe tip, and compensate for timing differences between voltage and current probes.
Signal analysis: The oscilloscope can be used to analyze signals with a variety of features, including waveform measurements, FFT analysis, and mask testing.
Data logging and storage: The TDS7000 Series can be used to log and store waveform data for later analysis.
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