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Measurements and results
R&S®ESW
19User Manual 1177.6300.02 ─ 11
3 Measurements and results
Access: "Overview" > "Select Measurement"
Or: [MEAS]
In the Spectrum application, the R&S ESW provides a variety of different measurement
functions.
●Basic measurements - measure the spectrum of your signal or watch your signal
in time domain
●Power measurements - calculate the powers involved in modulated carrier signals
●Emission measurements - detect unwanted signal emission
●Statistic measurements - evaluate the spectral distribution of the signal
●Further measurements - provide characteristic values of the signal
●EMI measurements - detect electromagnetic interference in the signal
The individual functions are described in detail in the following chapters.
The measurement function determines which settings, functions and evaluation meth-
ods are available in the R&S ESW. The various measurement functions are described
in detail here.
When you select a measurement function, the measurement is started with its default
settings immediately and the corresponding measurement configuration menu is dis-
played. The measurement configuration menu can be displayed at any time by press-
ing the [MEAS CONFIG] key.
The easiest way to configure measurements is using the configuration "Overview", see
Chapter 4.2, "Configuration overview", on page 221.
In addition to the measurement-specific parameters, the general parameters can be
configured as usual, see Chapter 4, "Common measurement settings", on page 221.
Many measurement functions provide special result displays or evaluation methods;
however, in most cases the general evaluation methods are also available, see Chap-
ter 5, "Common analysis and display functions", on page 334.
The remote commands required to retrieve measurement results are described in
Chapter 6.9.2.1, "Trace data retrieval", on page 693.
●Basic measurements...............................................................................................20
●Channel power and adjacent-channel power (ACLR) measurement......................40
●Carrier-to-noise measurements.............................................................................. 90
●Occupied bandwidth measurement (OBW).............................................................94
●Spectrum emission mask (SEM) measurement....................................................100
●Spurious emissions measurement........................................................................145
●Statistical measurements (APD, CCDF)............................................................... 158
●Time domain power measurement........................................................................172
●Harmonic distortion measurement........................................................................ 178
●Third order intercept (TOI) measurement............................................................. 184
●AM modulation depth measurement..................................................................... 194
●Electromagnetic interference (EMI) measurement................................................197