NXP i.MX 7 User guide

Brand: NXP

Model: i.MX 7

Type: User guide

This manual is also suitable for

i.MX7D

PCIe

Certification Guide for i.MX 7Dual

1. Introduction

This document provides a description of the procedures,

tools, and criteria for the PCI Express

(PCIe) Gen1 and

Gen2 electrical compliance test for i.MX 7Dual.

NXP Semiconductors

Document Number:

PCIECGFIMX7DUG

User's Guide

Rev.

02/2017

Contents

1. Introduction ........................................................................ 1

2. Test equipment ................................................................... 2

2.1. Test board ............................................................... 2

2.2. Measurement equipment ......................................... 2

2.3. Test environment .................................................... 5

2.4. Analysis software .................................................... 5

2.5. Additional information ............................................ 5

3. PCIE test basic procedures ................................................. 5

4. PCIE test results ............................................................... 10

4.1. PCIE 1.1 test results—internal clock .................... 10

4.2. PCIE 2.0 test results—internal clock .................... 11

5. Revision history ............................................................... 12

Test equipment

PCIe® Certification Guide for i.MX 7Dual, User's Guide, Rev. 0, 02/2017

2 NXP Semiconductors

2. Test equipment

2.1. Test board

The test is performed on the MCIMX7D EVK board.

2.2. Measurement equipment

This equipment is used to measure the signal quality:

• Oscilloscope: Agilent

DSO91304.

• Cables and adapters:

— Two Rosenberger

SMP-SMP cables P/N: 71L-19K2-19K2-00305C.

— Four Agilent SMA-SMP cables P/N: N4235-61602.

— Four Agilent BNC connectors P/N:54855-67604.

• Test fixture: CLB3.0 X1/X16.

• Mini-PCIe cover for the PCIe board.

Figure 1. SMP-SMP cable

Test equipment

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NXP Semiconductors 3

Figure 2. SMA-SMP cable

Figure 3. BNC connector

Test equipment

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Figure 4. CLB3.0 X1X16 with several key features highlighted

Figure 5. Mini-PCIe cover for the PCIe board

PCIE test basic procedures

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NXP Semiconductors 5

2.3. Test environment

• Operating system: Linux

OS L4.1.15_1.2.0.

• Additional software changes for the PCIe compliance test based on L4.1.15_1.2.0 are required.

To access the software changes, visit community.nxp.com/docs/DOC-333261.

2.4. Analysis software

• N5393C PCI Express test application.

2.5. Additional information

• Test items: contains the electrical test only.

• Test method and equipment operation:

— See PCI Express Architecture PHY Test Specification, rev. 2.0. (PCI-SIG: 2008, register

at www.pcisig.com to download the document).

www.pcisig.com/members/downloads/PCI_Express_Test_Spec_Electrical_Layer_2_0_re

v_1_0_17Sept2012_Final.pdf

— See PCI Express 2.0 CEM Signal Quality Testing for Add-in Cards using Agilent

DSO/DSA91304A 13GHz and DSOX/DSAX93204A 16-32GHz Real-Time Oscilloscopes,

Version 1.2 (PCI-SIG, 20110; register at www.pcisig.com to download the document).

www.pcisig.com/members/downloads/specifications/testprocedures/PCIE_2_0_Add_in_

Card_test_Agilent_DSOX9xxxxx_v1_2.pdf?referring_url=%2Fkws

• 100 MHz reference clock: internal PLL clock (default).

3. PCIE test basic procedures

Perform the test as follows:

1. Perform the oscilloscope calibration and cable de-skew, as described in Appendix A

2. Connect four BNC connectors to the oscilloscope channels 1, 2, 3, and 4.

3. Connect four SMA-SMP cables to the BNC connectors on the oscilloscope.

— Connect the SMP end of the SMA-SMP cable on channel 1 to J13 on the CLB board (it is

the positive data line).

— Connect the SMP end of the SMA-SMP cable on channel 3 to J12 on the CLB board (it is

the negative data line).

— Connect the SMP end of the SMA-SMP cable on channel 2 to J16 on the CLB board (it is

the positive clock line; 100 MHz).

— Connect the SMP end of the SMA-SMP cable on channel 4 to J9 on the CLB board (it is

the negative clock line; 100 MHz).

See Appendix A in the document PCI Express 2.0 CEM Signal Quality Testing for Add-in Cards using Agilent

DSO/DSA91304A 13GHz and DSOX/DSAX93204A 16-32GHz Real-Time Oscilloscopes, Version 1.2.

PCIE test basic procedures

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6 NXP Semiconductors

4. Insert the SD card that contains the PCIe test image into the SD4 slot and make sure that the boot

switches (SW10, SW11, and SW12) are set properly.

5. Connect the mini-PCIe cover to the PCIe daughter board via the mini-PCIe connector (J15) on

the i.MX7D EVK board.

6. Connect the CLB board via the PCIe connector (CN3) on the mini-PCIe cover to the PCIe

daughter board.

7. Set the following on the CLB board:

— Set the slide switch SW3 to “x1 REF CLK”, as shown in Figure 6.

— Set the slide switch SW4 to “x1 REF CLK MEAS”, as shown in Figure 7.

Figure 6. SW3 switch setting

Figure 7. SW4 switch setting

PCIE test basic procedures

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NXP Semiconductors 7

8. The whole connection is shown in this figure:

Figure 8. The whole connection

9. After the preparation is made, power the board on and run the PCIe test software on the

oscilloscope:

“Analyze—Automated Test Apps—N5393C PCI Express Test App”

10. Select the right options in the test software:

— In the “Device” menu, select the right test mode (if you want to run the PCIE 1.1 test,

select the “PCIE 1.1” option).

— In the “Test Point” menu, select the “System Board Tests” and “RefClk Tests” options.

— In the “Test Information” menu, select the “Clean Clock” option.

— When performing the x1 lane test, you don’t have to select anything in the “Data Lane”

menu.

— Keep the other options at their default values.

The following figure shows all the “Set Up” tab options.

PCIE test basic procedures

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Figure 9. “Set Up” tab setting in the PCIe test software

11. In the “Select Tests” tab, select “test all”.

12. In the “Connect” tab, double check whether the test cables are connected properly.

13. If you want to run the PCIE 1.1 test, select “Run Tests” and run the PCIE test.

14. If you want to run the PCIE 2.0 test, set the following:

— Use one SMP-SMP cable to connect J85 to J4 and another SMP-SMP cable to connect J5

to J87, as shown in the following figure.

PCIE test basic procedures

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NXP Semiconductors 9

Figure 10. PCIE 2.0 test settings

— Set the slide switch SW4 to “x1 COMP MODE SEL”, as shown in the following figure.

— Press the SW1 button to make sure that the interval between the most closely spaced

adjacent crossover locations is around 200 ps. (5 GT/s).

NOTE

When performing this setting, make sure that the board is powered on.

— Set the slide switch SW4 back to “x1 REF CLK MEAS”.

Figure 11. SW1 and SW4 settings for the PCIE 2.0 test

PCIE test results

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4. PCIE test results

On the i.MX7D EVK board, the internal clock is the default one. When performing the PCIE test, test

the eye-width, phase jitter, rising edge rate, and so on. Obtain the detailed information from the test

report.

4.1. PCIE 1.1 test results—internal clock

The detailed settings are provided in Section 2, “Test equipment”. After the test, obtain the test results

(as shown in the following table).

Table 1. PCIE 1.1 test results

Pass

# Failed # Trials

Test Name

Actual

Value

Margin Pass Limits

0 1 System Board Tx, Unit Interval (PCIE 1.1)

399.9960

48.3 %

399.8800 ps <= VALUE

<= 400.1200 ps

System Board Tx, Template Tests (PCIE 1.1)

Pass

100.0 %

Pass/Fail

System Board Tx, Median to Max Jitter (PCIE 1.1)

18.15 ps

76.4 %

VALUE <= 77.00 ps

System Board Tx, Eye-Width (PCIE 1.1)

354.89 ps

44.3 %

VALUE >= 246.00 ps

0 1

System Board Tx, Peak Differential Output Voltage

(Transition)(PCIE 1.1)

653.8 mV 41.0 %

274.0 mV <= VALUE <=

1.2000 V

0 1

System Board Tx, Peak Differential Output Voltage

(NonTransition)(PCIE 1.1)

565.2 mV 33.0 %

253.0 mV <= VALUE <=

1.2000 V

Reference Clock, Phase Jitter (PCIE 1.1)

33.54 ps

61.0 %

VALUE <= 86.00 ps

0 1 Reference Clock, Rising Edge Rate (PCIE 1.1) 2.02 V/ns 41.8 %

600 mV/ns <= VALUE

<= 4.00 V/ns

0 1 Reference Clock, Falling Edge Rate (PCIE 1.1) 2.01 V/ns 41.5 %

600 mV/ns <= VALUE

<= 4.00 V/ns

0 1

Reference Clock, Differential Input High Voltage

(PCIE 1.1)

603 mV 302.0 % VALUE >= 150 mV

0 1

Reference Clock, Differential Input Low Voltage

(PCIE 1.1)

-596 mV 297.3 % VALUE <= -150 mV

0 1 Reference Clock, Average Clock Period (PCIE 1.1) -12 ppm 48.0 %

-300 ppm <= VALUE <=

300 ppm

0 1 Reference Clock, Duty Cycle (PCIE 1.1) 50.2 % 49.0 %

40.0 % <= VALUE <=

60.0 %

0 1

Reference Clock, Absolute Crossing Point Voltage

(PCIE 1.1)

261.8 mV 3.9 %

250.0 mV <= VALUE <=

550.0 mV

Reference Clock, Variation of VCross (PCIE 1.1)

40.7 mV

70.9 %

VALUE <= 140.0 mV

0 1

Reference Clock, Absolute Max Input Voltage (PCIE

1.1)

601.1 mV 47.7 % VALUE <= 1.1500 V

0 1

Reference Clock, Absolute Min Input Voltage (PCIE

1.1)

-18.2 mV 93.9 % VALUE >= -300.0 mV

Reference Clock, Rise-Fall Matching (PCIE 1.1)

5.14 %

74.3 %

VALUE <= 20.00 %

The main information about the PCIE 1.1 test are shown in the above table.

PCIE test results

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NXP Semiconductors 11

4.2. PCIE 2.0 test results—internal clock

NOTE

When performing the PCIE 2.0 test, pay attention to step 14 (described in

Section 2, “Test equipment”).

The test results are shown in the following table.

Table 2. PCIE 2.0 test report

Pass

# Failed # Trials

Test Name Actual Value

Margin Pass Limits

0 1 System Board Tx, Unit Interval (PCIE 2.0, 5.0 GT/s) 199.9990 ps 49.2 %

199.9400 ps <=

VALUE <= 200.0600

0 1

System Board Tx, Template Tests (PCIE 2.0, 5.0

GT/s)

Pass 100.0 % Pass/Fail

0 1

System Board Tx, Peak Differential Output Voltage

(Transition)(PCIE 2.0, 5.0 GT/s)

687.9 mV 43.1 %

300.0 mV <= VALUE

<= 1.2000 V

0 1

System Board Tx, Peak Differential Output Voltage

(Non Transition)(PCIE 2.0, 5.0 GT/s)

574.4 mV 30.5 %

300.0 mV <= VALUE

<= 1.2000 V

0 1

System Board Tx, Eye-Width with crosstalk (PCIE

2.0, 5.0 GT/s)

161.48 ps 70.0 % VALUE >= 95.00 ps

0 1

System Board Tx, RMS Random Jitter with crosstalk

(PCIE 2.0, 5.0 GT/s)

1.863 ps 75.0 % VALUE <= 7.460 ps

0 1

System Board Tx, Maximum Deterministic Jitter with

crosstalk (PCIE 2.0, 5.0 GT/s)

12.312 ps 78.4 % VALUE <= 57.000 ps

0 1

System Board Tx, Total Jitter at BER-12 with

crosstalk (PCIE 2.0, 5.0 GT/s)

38.524 ps 63.3 % VALUE <= 105.000 ps

0 1

System Board Tx, Eye-Width without crosstalk (PCIE

2.0, 5.0 GT/s)

161.48 ps 49.5 % VALUE >= 108.00 ps

0 1

System Board Tx, RMS Random Jitter without

crosstalk (PCIE 2.0, 5.0 GT/s)

1.863 ps 71.5 % VALUE <= 6.540 ps

0 1

System Board Tx, Maximum Deterministic Jitter

without crosstalk (PCIE 2.0, 5.0 GT/s)

12.312 ps 72.0 % VALUE <= 44.000 ps

0 1

System Board Tx, Total Jitter at BER-12 without

crosstalk (PCIE 2.0, 5.0 GT/s)

38.524 ps 58.1 % VALUE <= 92.000 ps

0 1

Reference Clock, High frequency > 1.5MHz RMS

Jitter (Common Clk) (PCIE 2.0, 5.0 GT/s)

2.28 ps 26.5 % VALUE <= 3.10 ps

0 1

Reference Clock, Low frequency 10kHz - 1.5MHz

RMS Jitter (Common Clk) (PCIE 2.0, 5.0 GT/s)

400 fs 86.7 % VALUE <= 3.00 ps

0 1

Reference Clock, High frequency > 1.5MHz RMS

Jitter (Data Clk) (PCIE 2.0, 5.0 GT/s)

2.74 ps 31.5 % VALUE <= 4.00 ps

0 1

Reference Clock, Low frequency 10kHz - 1.5MHz

RMS Jitter (Data Clk) (PCIE 2.0, 5.0 GT/s)

580 fs 92.3 % VALUE <= 7.50 ps

The main information about the PCIE 2.0 test are listed in the above table.

Revision history

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12 NXP Semiconductors

5. Revision history

This table summarizes the changes done to this document since the initial release:

Table 3. Revision history

Revision number Date Substantive changes

02/2017

Initial release

Document Number: PCIECGFIMX7DUG

Rev. 0

02/2017

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NXP i.MX 7 User guide

Brand: NXP

Model: i.MX 7

Type: User guide

This manual is also suitable for

i.MX7D

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NXP i.MX 7 User guide

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