Leica Microsystems EM TIC 3X
The Leica Microsystems EM TIC 3X is a high-precision cross-sectioning and polishing system for preparing samples for transmission electron microscopy (TEM). It is capable of producing high-quality cross-sections of a wide range of materials, including metals, ceramics, and polymers. The system is also capable of polishing samples to a high surface finish, making it ideal for preparing samples for scanning transmission electron microscopy (STEM).
The EM TIC 3X is equipped with a high-power ion beam source that can be used to mill samples at a variety of angles. The system also has a precision polishing stage that can be used to polish samples to a high surface finish. The EM TIC 3X is a versatile system that can be used for a wide range of applications, including:
Leica Microsystems EM TIC 3X
The Leica Microsystems EM TIC 3X is a high-precision cross-sectioning and polishing system for preparing samples for transmission electron microscopy (TEM). It is capable of producing high-quality cross-sections of a wide range of materials, including metals, ceramics, and polymers. The system is also capable of polishing samples to a high surface finish, making it ideal for preparing samples for scanning transmission electron microscopy (STEM).
The EM TIC 3X is equipped with a high-power ion beam source that can be used to mill samples at a variety of angles. The system also has a precision polishing stage that can be used to polish samples to a high surface finish. The EM TIC 3X is a versatile system that can be used for a wide range of applications, including:
Leica Microsystems EM TIC 3X
The Leica Microsystems EM TIC 3X is a high-precision cross-sectioning and polishing system for preparing samples for transmission electron microscopy (TEM). It is capable of producing high-quality cross-sections of a wide range of materials, including metals, ceramics, and polymers. The system is also capable of polishing samples to a high surface finish, making it ideal for preparing samples for scanning transmission electron microscopy (STEM).
The EM TIC 3X is equipped with a high-power ion beam source that can be used to mill samples at a variety of angles. The system also has a precision polishing stage that can be used to polish samples to a high surface finish. The EM TIC 3X is a versatile system that can be used for a wide range of applications, including:
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